KAST
EOS Tester
KT-200SG
EOS TESTER
This equipment is designed to test the EMI (Electro Magnetic Immunity) capability of electrical and electronic components, ICs, finished products, and electronic circuits.
It is widely used as a surge tester to evaluate the impulse withstand capability and damage susceptibility of semiconductors, LCDs, TFT flat panel displays and their drive circuits, components, power circuits, PCBs, and communication equipment.
For these tests, the equipment is designed to generate 4 to 5 different types of impulse waveforms.
Contact Us
054-474-6490~1
hello@kasteng.com
Mon-Fri 09:00~18:00 KST
Specifications
| Test Voltage Output Range | 5 ~ 200 V Impulse |
| Output Voltage Polarity | Bipolar (Positive and Negative) output |
| Wave 1 | Combination Waveform per IEC 61000-4-5 / a. Open-circuit voltage waveform: 1.2 / 50 ㎲ / b. Short-circuit current waveform: 8 / 20 ㎲ (Output Impedance: 2 Ω) |
| Wave 2 | 5/50 ㎲ open-circuit voltage waveform (Output Impedance: 40 Ω) |
| Wave 3 | 10/100 ㎲ open-circuit voltage waveform (Output Impedance: 40 Ω) |
| Wave 4 | 10/200 ㎲ open-circuit voltage waveform (Output Impedance: 40 Ω) |
| Auto / Manual Test Mode | In automatic test mode, the interval timer and counter allow continuous automatic testing for the desired number of repetitions. |
| Supply Voltage | AC 220 V, 50 ~ 60 ㎐ |
| Power Consumption | Approx. 80 W |
| Dimensions | W 420 × H 210 × D 580 (㎜) |
| Weight | Approx. 24 ㎏ |